STUDIES OF TEMPERATURE EFFECTS IN AC THIN-FILM EL DEVICES

被引：26

作者：

YANG, KW ^{[1
]}

OWEN, JT ^{[1
]}

SMITH, DH ^{[1
]}

机构：

[1] TEKTRONIX INC,DISPLAY RES GRP,BEAVERTON,OR 97077

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1981年 / 28卷 / 06期

关键词：

D O I：

10.1109/T-ED.1981.20416

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：703 / 708

页数：6

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[9] EVIDENCE FOR DIRECT IMPACT EXCITATION OF MN CENTERS IN ELECTROLUMINESCENT ZNS-MN FILMS [J].

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[10] ELECTRIC-FIELD EFFECT ON THE THERMAL EMISSION OF TRAPS IN SEMICONDUCTOR JUNCTIONS [J].

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