CHARACTERIZATION OF THE CHEMICAL BONDING IN INNER LAYERS OF COMPOSITE-MATERIALS

被引：8

作者：

SCHNEIDER, R ^{[1
]}

WOLTERSDORF, J ^{[1
]}

RODER, A ^{[1
]}

机构：

[1] UNIV HALLE WITTENBERG,FACHBEREICH PHYS,D-06108 HALLE,GERMANY

来源：

FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1995年 / 353卷 / 3-4期

关键词：

D O I：

10.1007/BF00322049

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The efficiency of near edge structure investigations in electron energy loss spectroscopy (EELS) is discussed for characterizing the chemical bonding of elements present in the interfacial zone in fibre/matrix composites at nanometre resolution. Two different examples of corresponding analyses are given for a SiC-fibre reinforced borosilicate glass. In particular, the chemical bonding between silicon and carbon or oxygen (e.g. SiC, SiO2 and SiOxCy), respectively, is characterized. The results have been attained in a fingerprint manner by comparing the fine structure measured from a material of unknown stoichiometry to that of a standard specimen. In addition, a possibility is demonstrated to image the chemical bonding by energy-filtered microscopy using energy loss near edge structures (ELNES).

引用

页码：263 / 266

页数：4

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