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DEEP LEVELS IN GALLIUM-ARSENIDE BY CAPACITANCE METHODS
被引:55
作者
:
SAKAI, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV TOKYO,INST IND SCI,7-22-1 ROPPONGI,MINATO,TOKYO,JAPAN
UNIV TOKYO,INST IND SCI,7-22-1 ROPPONGI,MINATO,TOKYO,JAPAN
SAKAI, K
[
1
]
IKOMA, T
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV TOKYO,INST IND SCI,7-22-1 ROPPONGI,MINATO,TOKYO,JAPAN
UNIV TOKYO,INST IND SCI,7-22-1 ROPPONGI,MINATO,TOKYO,JAPAN
IKOMA, T
[
1
]
机构
:
[1]
UNIV TOKYO,INST IND SCI,7-22-1 ROPPONGI,MINATO,TOKYO,JAPAN
来源
:
APPLIED PHYSICS
|
1974年
/ 5卷
/ 02期
关键词
:
D O I
:
10.1007/BF00928230
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:165 / 171
页数:7
相关论文
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BEHAVIOR OF LATTICE DEFECTS IN GAAS
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[J].
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: 225
-
&
[2]
THERMAL AND OPTICAL GENERATION CURRENT IN REVERSE-BIASED GOLD-DOPED SILICON P+N JUNCTIONS WITHOUT DEPLETION APPROXIMATION
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LUND INST TECHNOL, DEPT SOLID STATE PHYS, LUND 7, SWEDEN
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LUND INST TECHNOL, DEPT SOLID STATE PHYS, LUND 7, SWEDEN
GRIMMEISS, HG
[J].
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1973,
44
(06)
: 2789
-
2794
[3]
BUBE RH, 1962, PHYS REV, V128, P2062, DOI 10.1103/PhysRev.128.2062
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[J].
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(02)
: 315
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[5]
IMPURITY CENTERS IN PN JUNCTIONS DETERMINED FROM SHIFTS IN THERMALLY STIMULATED CURRENT AND CAPACITANCE RESPONSE WITH HEATING RATE
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0
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[J].
SOLID-STATE ELECTRONICS,
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ELECTROABSORPTION BY SUBSTITUTIONAL COPPER IMPURITIES IN GAAS
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[J].
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: 2583
-
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YANAGISAWA, S
WADA, O
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0
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0
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机构:
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
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FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
TAKANASHI, H
[J].
APPLIED PHYSICS LETTERS,
1973,
23
(03)
: 150
-
151
←
1
2
→
共 20 条
[1]
BEHAVIOR OF LATTICE DEFECTS IN GAAS
BLANC, J
论文数:
0
引用数:
0
h-index:
0
BLANC, J
WEISBERG, LR
论文数:
0
引用数:
0
h-index:
0
WEISBERG, LR
BUBE, RH
论文数:
0
引用数:
0
h-index:
0
BUBE, RH
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1964,
25
(02)
: 225
-
&
[2]
THERMAL AND OPTICAL GENERATION CURRENT IN REVERSE-BIASED GOLD-DOPED SILICON P+N JUNCTIONS WITHOUT DEPLETION APPROXIMATION
BRAUN, S
论文数:
0
引用数:
0
h-index:
0
机构:
LUND INST TECHNOL, DEPT SOLID STATE PHYS, LUND 7, SWEDEN
LUND INST TECHNOL, DEPT SOLID STATE PHYS, LUND 7, SWEDEN
BRAUN, S
GRIMMEISS, HG
论文数:
0
引用数:
0
h-index:
0
机构:
LUND INST TECHNOL, DEPT SOLID STATE PHYS, LUND 7, SWEDEN
LUND INST TECHNOL, DEPT SOLID STATE PHYS, LUND 7, SWEDEN
GRIMMEISS, HG
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(06)
: 2789
-
2794
[3]
BUBE RH, 1962, PHYS REV, V128, P2062, DOI 10.1103/PhysRev.128.2062
[4]
PHOTOELECTRONIC ANALYSIS OF HIGH RESISTIVITY CRYSTALS - (A) GAAS, (B) SB2S3
BUBE, RH
论文数:
0
引用数:
0
h-index:
0
BUBE, RH
[J].
JOURNAL OF APPLIED PHYSICS,
1960,
31
(02)
: 315
-
322
[5]
IMPURITY CENTERS IN PN JUNCTIONS DETERMINED FROM SHIFTS IN THERMALLY STIMULATED CURRENT AND CAPACITANCE RESPONSE WITH HEATING RATE
BUEHLER, MG
论文数:
0
引用数:
0
h-index:
0
BUEHLER, MG
[J].
SOLID-STATE ELECTRONICS,
1972,
15
(01)
: 69
-
+
[6]
ELECTROABSORPTION BY SUBSTITUTIONAL COPPER IMPURITIES IN GAAS
BURGIEL, JC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Telephone Laboratories, Incorporated, Murray Hill
BURGIEL, JC
BRAUN, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Telephone Laboratories, Incorporated, Murray Hill
BRAUN, HJ
[J].
JOURNAL OF APPLIED PHYSICS,
1969,
40
(06)
: 2583
-
&
[7]
FABRE E, 1973, AUG C EL MAT LAS VEG
[8]
HALL-EFFECT LEVELS PRODUCED IN TE-DOPED GAAS CRYSTALS BY CU DIFFUSION
FULLER, CS
论文数:
0
引用数:
0
h-index:
0
FULLER, CS
WOLFSTIRN, KB
论文数:
0
引用数:
0
h-index:
0
WOLFSTIRN, KB
ALLISON, HW
论文数:
0
引用数:
0
h-index:
0
ALLISON, HW
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(07)
: 2873
-
+
[9]
GLOVER GH, 1972, IEEE T ELECTRON DEVI, VED19, P138
[10]
DETERMINATION OF DEEP-LEVEL ENERGY AND DENSITY PROFILES IN INHOMOGENEOUS SEMICONDUCTORS
GOTO, G
论文数:
0
引用数:
0
h-index:
0
机构:
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
GOTO, G
YANAGISAWA, S
论文数:
0
引用数:
0
h-index:
0
机构:
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
YANAGISAWA, S
WADA, O
论文数:
0
引用数:
0
h-index:
0
机构:
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
WADA, O
TAKANASHI, H
论文数:
0
引用数:
0
h-index:
0
机构:
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
FUJITSU LABS LTD, KAMIKODANAKA, KAWASAKI, JAPAN
TAKANASHI, H
[J].
APPLIED PHYSICS LETTERS,
1973,
23
(03)
: 150
-
151
←
1
2
→