MICROFIELDS IN STROBOSCOPIC VOLTAGE MEASUREMENTS VIA ELECTRON-EMISSION .2. EFFECTS ON ELECTRON DYNAMICS

被引：14

作者：

CLAUBERG, R

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 10期

关键词：

D O I：

10.1063/1.339113

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4017 / 4023

页数：7

共 16 条

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