ELLIPSOMETRIC-SPECTROSCOPY OF FILMS FORMED ON METALS IN SOLUTION

[11] NAGAYAMA N, 1962, J ELECTROCHEM SOC, V109, P781

[12] NUMERICAL TECHNIQUES FOR ANALYSIS OF LOSSY FILMS [J]. SURFACE SCIENCE, 1969, 16 : 97 - &

[13] CORRELATION BETWEEN ELLIPSOMETRIC AND ELECTRICAL MEASUREMENTS ON PASSIVE IRON [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (12) : 1258 - &

[14] ELLIPSOMETRIC DETERMINATION OF FILM THICKNESS AND CONDUCTIVITY DURING PASSIVATION PROCESS ON NICKEL [J]. JOURNAL OF CHEMICAL PHYSICS, 1965, 42 (06) : 2246 - &

[15] OPTICAL CONSTANTS OF IRON IN VISIBLE REGION [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (07) : 842 - &

[11] NAGAYAMA N, 1962, J ELECTROCHEM SOC, V109, P781

[12] NUMERICAL TECHNIQUES FOR ANALYSIS OF LOSSY FILMS [J]. SURFACE SCIENCE, 1969, 16 : 97 - &

[13] CORRELATION BETWEEN ELLIPSOMETRIC AND ELECTRICAL MEASUREMENTS ON PASSIVE IRON [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (12) : 1258 - &

[14] ELLIPSOMETRIC DETERMINATION OF FILM THICKNESS AND CONDUCTIVITY DURING PASSIVATION PROCESS ON NICKEL [J]. JOURNAL OF CHEMICAL PHYSICS, 1965, 42 (06) : 2246 - &

[15] OPTICAL CONSTANTS OF IRON IN VISIBLE REGION [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (07) : 842 - &