LIMITS OF IMAGING RESOLUTION FOR ATOMIC FORCE MICROSCOPY OF MOLECULES

被引:110
作者
WEIHS, TP
NAWAZ, Z
JARVIS, SP
PETHICA, JB
机构
[1] Department of Materials, Oxford, OX1 3PH, Parks Road
关键词
D O I
10.1063/1.105649
中图分类号
O59 [应用物理学];
学科分类号
摘要
The imaging resolution of an atomic force microscope operating in contact with a Langmuir-Blodgett (LB) film is predicted as a function of applied force, tip radius, adhesive force, and tip and film properties. The elastic modulus and the hardness of the LB film were measured using a nanoindenter and the imaging resolution is predicted using both a simple Hertzian elastic analysis and one that includes adhesive forces between the tip and the sample. For a small applied force (< 1 nN) the resolution improves sharply as the tip radius and the adhesive force decrease. The onset of inelastic deformation, however, limits the resolution of the sharpest tips.
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页码:3536 / 3538
页数:3
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