HEAT-TRANSPORT AND CURRENT CROWDING IN IMPATT DIODES

[1] ANALYTIC AND EXPERIMENTAL TECHNIQUES FOR EVALUATING TRANSIENT THERMAL CHARACTERISTICS OF TRAPATT DIODES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (08) : 480 - 487

[2] CARSLAW HS, 1959, CONDUCTION HEAT SOLI, P217

[3] TRANSIENT TEMPERATURE RESPONSE OF AN AVALANCHE DIODE [J]. SOLID-STATE ELECTRONICS, 1970, 13 (06) : 799 - +

[4] TEMPERATURE AND CURRENT DISTRIBUTION IN AN AVALANCHING P-N JUNCTION [J]. SOLID-STATE ELECTRONICS, 1968, 11 (11) : 1007 - &

[5] HOLWAY LH, 1976, IEEE T ELECTRON OCT, P1194

[6] MORSE PM, 1953, METHODS THEORETICAL, P803

[7] STATZ H, 1976, IEEE T ELECTRON SEP, P1075

[8] WALLACE RJ, COMMUNICATION

[1] ANALYTIC AND EXPERIMENTAL TECHNIQUES FOR EVALUATING TRANSIENT THERMAL CHARACTERISTICS OF TRAPATT DIODES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (08) : 480 - 487

[2] CARSLAW HS, 1959, CONDUCTION HEAT SOLI, P217

[3] TRANSIENT TEMPERATURE RESPONSE OF AN AVALANCHE DIODE [J]. SOLID-STATE ELECTRONICS, 1970, 13 (06) : 799 - +

[4] TEMPERATURE AND CURRENT DISTRIBUTION IN AN AVALANCHING P-N JUNCTION [J]. SOLID-STATE ELECTRONICS, 1968, 11 (11) : 1007 - &

[5] HOLWAY LH, 1976, IEEE T ELECTRON OCT, P1194

[6] MORSE PM, 1953, METHODS THEORETICAL, P803

[7] STATZ H, 1976, IEEE T ELECTRON SEP, P1075

[8] WALLACE RJ, COMMUNICATION