THERMAL-OXIDATION OF INAS

[1] BAGLEE DA, 1980, JAN C PHYS COMP SEM

[2] BAGLEE DA, UNPUBLISHED

[3] CZANDERNA AW, 1975, METHODS SURFACE ANAL, P108

[4] DETECTION OF EXCESS CRYSTALLINE AS AND SB IN III-V OXIDE INTERFACES BY RAMAN-SCATTERING [J]. APPLIED PHYSICS LETTERS, 1977, 31 (11) : 768 - 770

[5] TRANSPORT OF ELECTRONS IN QUANTIZED INVERSION AND ACCUMULATION LAYERS IN III-V COMPOUNDS [J]. THIN SOLID FILMS, 1979, 56 (1-2) : 243 - 252

[6] FROMHOLD AT, 1975, THEORY METAL OXIDATI, V1

[7] LOCAL ATOMIC AND ELECTRONIC-STRUCTURE OF OXIDE-GAAS AND SIO2-SI INTERFACES USING HIGH-RESOLUTION XPS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1443 - 1453

[8] KAWAJI S, 1966, J PHYS SOC JPN, VS 21, P336

[9] IN-DEPTH PROFILES OF OXIDE-FILMS ON GAAS STUDIED BY XPS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 : 327 - 333

[10] REICH RK, UNPUBLISHED

[1] BAGLEE DA, 1980, JAN C PHYS COMP SEM

[2] BAGLEE DA, UNPUBLISHED

[3] CZANDERNA AW, 1975, METHODS SURFACE ANAL, P108

[4] DETECTION OF EXCESS CRYSTALLINE AS AND SB IN III-V OXIDE INTERFACES BY RAMAN-SCATTERING [J]. APPLIED PHYSICS LETTERS, 1977, 31 (11) : 768 - 770

[5] TRANSPORT OF ELECTRONS IN QUANTIZED INVERSION AND ACCUMULATION LAYERS IN III-V COMPOUNDS [J]. THIN SOLID FILMS, 1979, 56 (1-2) : 243 - 252

[6] FROMHOLD AT, 1975, THEORY METAL OXIDATI, V1

[7] LOCAL ATOMIC AND ELECTRONIC-STRUCTURE OF OXIDE-GAAS AND SIO2-SI INTERFACES USING HIGH-RESOLUTION XPS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1443 - 1453

[8] KAWAJI S, 1966, J PHYS SOC JPN, VS 21, P336

[9] IN-DEPTH PROFILES OF OXIDE-FILMS ON GAAS STUDIED BY XPS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 : 327 - 333

[10] REICH RK, UNPUBLISHED