ADMITTANCE SPECTROSCOPY OF INALAS/INGAAS SINGLE-QUANTUM-WELL STRUCTURE WITH HIGH-CONCENTRATION OF ELECTRON TRAPS IN INALAS LAYERS

被引:14
作者
BROUNKOV, PN
BENYATTOU, T
GUILLOT, G
CLARK, SA
机构
[1] UNIV WALES COLL CARDIFF,DEPT PHYS & ASTRON,CARDIFF CF1 3TH,S GLAM,WALES
[2] AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA
关键词
D O I
10.1063/1.359383
中图分类号
O59 [应用物理学];
学科分类号
摘要
Results are presented of admittance spectroscopy measurements on the lattice-matched In0.52Al0.48As/In0.53Ga 0.47As single-quantum-well structures. It has been found that the perpendicular conductivity of the structure is controlled by the strong temperature dependence of the space-charge region width around the quantum-well layer. This process is governed by a high density of deep electron traps present in the layers adjacent to the quantum well. Therefore, the energy activation of perpendicular conductivity is determined by the deep-level defects rather than the thermionic emission of electrons from the quantum well. Because of this, it is impossible to extract the magnitude of the band offset between the quantum well and barrier layers from the admittance measurements performed in this study. © 1995 American Institute of Physics.
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页码:240 / 243
页数:4
相关论文
共 19 条
[1]   ELECTRICAL CHARACTERIZATION OF A GAAS QUANTUM-WELL CONFINED BY GAALAS LAYERS OR BY 2 SUPERLATTICES [J].
ABABOU, S ;
GUILLOT, G ;
REGRENY, A .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (09) :4134-4138
[2]  
BATEY J, 1985, J APPL PHYS, V59, P200
[3]  
BENYATTOU T, UNPUB
[4]   ADMITTANCE SPECTROSCOPY MEASUREMENT OF BAND OFFSETS IN STRAINED LAYERS OF INXGA1-XAS GROWN ON INP [J].
CAVICCHI, RE ;
LANG, DV ;
GERSHONI, D ;
SERGENT, AM ;
VANDENBERG, JM ;
CHU, SNG ;
PANISH, MB .
APPLIED PHYSICS LETTERS, 1989, 54 (08) :739-741
[5]   AN N-IN0.53GA0.47AS-N-INP RECTIFIER [J].
FORREST, SR ;
KIM, OK .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (09) :5838-5842
[6]   DEEP LEVELS AND A POSSIBLE D-X-LIKE CENTER IN MOLECULAR-BEAM EPITAXIAL INXAL1-XAS [J].
HONG, WP ;
DHAR, S ;
BHATTACHARYA, PK ;
CHIN, A .
JOURNAL OF ELECTRONIC MATERIALS, 1987, 16 (04) :271-274
[7]  
KROEMER H, 1980, APPL PHYS LETT, V36, P95
[8]   MEASUREMENT OF HETEROJUNCTION BAND OFFSETS BY ADMITTANCE SPECTROSCOPY - INP/GA0.47IN0.53AS [J].
LANG, DV ;
PANISH, MB ;
CAPASSO, F ;
ALLAM, J ;
HAMM, RA ;
SERGENT, AM ;
TSANG, WT .
APPLIED PHYSICS LETTERS, 1987, 50 (12) :736-738
[9]   ADMITTANCE SPECTROSCOPY MEASUREMENT OF BAND OFFSET IN GAAS-GAALAS MULTIQUANTUM WELL [J].
LETARTRE, X ;
STIEVENARD, D ;
LANNOO, M ;
LIPPENS, D .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (01) :116-119
[10]   ANALYTICAL CALCULATION OF THE CAPACITANCE ASSOCIATED WITH A SINGLE QUANTUM-WELL LOCATED IN A JUNCTION [J].
LETARTRE, X ;
STIEVENARD, D ;
BARBIER, E .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (11) :7912-7914