DETERMINATION OF REFRACTIVE-INDEX OF THIN-FILMS BEYOND THE ABSORPTION-EDGE

被引：13

作者：

BHATTACHARYYA, D ^{[1
]}

BHATTACHARYYA, SK ^{[1
]}

CHAUDHURI, S ^{[1
]}

PAL, AK ^{[1
]}

机构：

[1] CENT GLASS & CERAM RES INST,CALCUTTA 700032,W BENGAL,INDIA

来源：

VACUUM | 1993年 / 44卷 / 10期

关键词：

D O I：

10.1016/0042-207X(93)90282-F

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A novel methodology for accurate determination of refractive index (n) of thin film deposited onto nonabsorbing substrate is indicated.

引用

页码：979 / 981

页数：3

共 18 条

[1] OPTICAL-PROPERTIES OF VACUUM-EVAPORATED CDTE THIN-FILMS
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MORENZA, JL
ESTEVE, J
CODINA, JM
[J]. THIN SOLID FILMS, 1984, 120 (01) : 23 - 30
[2] GROWTH OF CDTE-FILMS ON NACL AND GLASS SUBSTRATES
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CHAUDHURI, S
PAL, AK
[J]. VACUUM, 1992, 43 (04) : 313 - 316
[4] BURSTEIN MOSS SHIFT IN CULNSE2 FILMS
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[J]. VACUUM, 1991, 42 (14) : 915 - 918
[5] CHARACTERIZATION OF CDS FILM PREPARED BY HOT WALL TECHNIQUE
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PAL, AK
[J]. SOLAR ENERGY MATERIALS, 1984, 10 (02): : 223 - 233
[6] OPTICAL-TRANSITIONS IN CDTE THIN-FILMS PRODUCED BY HOT-WALL VACUUM EVAPORATION
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PAL, AK
[J]. THIN SOLID FILMS, 1987, 147 (01) : 9 - 16
[7] STRUCTURAL AND OPTICAL-PROPERTIES OF RF-SPUTTERED CDS THIN-FILMS
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SANCHEZQUESADA, F
RODRIGUEZVIDAL, M
[J]. THIN SOLID FILMS, 1984, 120 (01) : 31 - 36
[8] DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILMS FROM MEASUREMENTS OF REFLECTANCE AND TRANSMITTANCE AT NORMAL INCIDENCE
DENTON, RE
TOMLIN, SG
CAMPBELL, RD
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (04) : 852 - &
[9] SOME PARAMETERS AFFECTING THE OPTICAL-CONSTANTS OF CDTE THIN EVAPORATED-FILMS
ELSHAZLY, AA
ELSHAIR, HT
[J]. THIN SOLID FILMS, 1981, 78 (03) : 287 - 293
[10] OPTICAL PROPERTIES OF THIN FILMS OF CADMIUM SULFIDE
GOTTESMAN, J
FERGUSON, WFC
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1954, 44 (05) : 368 - 370

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