CHARACTERISTICS OF P-CHANNEL MOS FIELD-EFFECT TRANSISTORS WITH ION-IMPLANTED CHANNELS

被引:25
作者
HSWE, M
SHOPBELL, ML
MAI, CC
PALMER, RB
机构
关键词
D O I
10.1016/0038-1101(72)90044-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1237 / +
页数:1
相关论文
共 15 条
[1]  
AUBUCHON KG, 1969, INT C PROPERTIES USE
[2]   INFLUENCE OF NON-UNIFORMLY DOPED SUBSTRATES ON MOS C-V CURVES [J].
BROTHERTON, SD ;
BURTON, P .
SOLID-STATE ELECTRONICS, 1970, 13 (12) :1591-+
[3]   N-TYPE SURFACE CONDUCTIVITY ON P-TYPE GERMANIUM [J].
BROWN, WL .
PHYSICAL REVIEW, 1953, 91 (03) :518-527
[4]   SILICON GATE TECHNOLOGY [J].
FAGGIN, F ;
KLEIN, T .
SOLID-STATE ELECTRONICS, 1970, 13 (08) :1125-&
[5]   SURFACE EFFECTS ON P-N JUNCTIONS - CHARACTERISTICS OF SURFACE SPACE-CHARGE REGIONS UNDER NON-EQUILIBRIUM CONDITIONS [J].
GROVE, AS ;
FITZGERALD, DJ .
SOLID-STATE ELECTRONICS, 1966, 9 (08) :783-+
[6]  
GROVE AS, 1970, PHYSICS TECHNOLOGY S
[7]  
JOHNSON WS, 1969, STANFORD U REPORT
[8]  
MACDOUGALL J, 1970, ELECTRONICS-US, V43, P86
[9]  
MACPHERSON MR, 1971, APPL PHYS LETT, V18, P502, DOI 10.1063/1.1653513
[10]  
MCKENNY V, 1971, ELECTRONICS, V44, P80