PULSE-METHOD FOR MEASURING CARRIER-LIFETIME IN MIDDLE REGION OF PIN STRUCTURES

[1] BARON, 1965, J APPL PHYS, V37, P2614

[2] BARSUKOV YK, 1958, SOV PHYS-TECH PHYS, P806

[3] OBSERVATIONS ON A METHOD OF DETERMINING CARRIER LIFETIME IN P+-NU-N+ DIODES [J]. SOLID-STATE ELECTRONICS, 1969, 12 (05) : 385 - &

[4] BROUSSEAU M, 1968, CR ACAD SCI B PHYS, V266, P502

[5] USE OF MICROWAVE TECHNIQUES FOR MEASURING CARRIER LIFETIME AND MOBILITY IN SEMICONDUCTORS [J]. SOLID-STATE ELECTRONICS, 1969, 12 (05) : 417 - +

[6] USE OF P-L-N STRUCTURES IN INVESTIGATIONS OF TRANSIENT RECOMBINATION FROM HIGH INJECTION LEVELS IN SEMICONDUCTORS [J]. PROCEEDINGS OF THE IEEE, 1963, 51 (11) : 1637 - &

[7] AN EXPERIMENTAL DETERMINATION OF THE CARRIER LIFETIME IN P-I-N DIODES FROM THE STORED CARRIER CHARGE [J]. SOLID-STATE ELECTRONICS, 1964, 7 (10) : 717 - 724

[8] LAX B, 1957, J APPL PHYS, V28, P8

[9] MEASUREMENT OF MINORITY CARRIER LIFETIME AND SURFACE EFFECTS IN JUNCTION DEVICES [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1955, 43 (04): : 477 - 483

[10] SCHANGENOTTO H, 1969, SOLID ST ELECTRON, V12, P267

[1] BARON, 1965, J APPL PHYS, V37, P2614

[2] BARSUKOV YK, 1958, SOV PHYS-TECH PHYS, P806

[3] OBSERVATIONS ON A METHOD OF DETERMINING CARRIER LIFETIME IN P+-NU-N+ DIODES [J]. SOLID-STATE ELECTRONICS, 1969, 12 (05) : 385 - &

[4] BROUSSEAU M, 1968, CR ACAD SCI B PHYS, V266, P502

[5] USE OF MICROWAVE TECHNIQUES FOR MEASURING CARRIER LIFETIME AND MOBILITY IN SEMICONDUCTORS [J]. SOLID-STATE ELECTRONICS, 1969, 12 (05) : 417 - +

[6] USE OF P-L-N STRUCTURES IN INVESTIGATIONS OF TRANSIENT RECOMBINATION FROM HIGH INJECTION LEVELS IN SEMICONDUCTORS [J]. PROCEEDINGS OF THE IEEE, 1963, 51 (11) : 1637 - &

[7] AN EXPERIMENTAL DETERMINATION OF THE CARRIER LIFETIME IN P-I-N DIODES FROM THE STORED CARRIER CHARGE [J]. SOLID-STATE ELECTRONICS, 1964, 7 (10) : 717 - 724

[8] LAX B, 1957, J APPL PHYS, V28, P8

[9] MEASUREMENT OF MINORITY CARRIER LIFETIME AND SURFACE EFFECTS IN JUNCTION DEVICES [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1955, 43 (04): : 477 - 483

[10] SCHANGENOTTO H, 1969, SOLID ST ELECTRON, V12, P267