STRUCTURAL DEPENDENCE OF ELECTRICAL-CONDUCTIVITY OF THIN TELLURIUM-FILMS

被引：38

作者：

DINNO, MA

SCHWARTZ, M

GIAMMARA, B

机构：

[1] UNIV LOUISVILLE,DEPT PHYS,LOUISVILLE,KY 40208

[2] UNIV LOUISVILLE,SCH DENT,LOUISVILLE,KY 40208

来源：

JOURNAL OF APPLIED PHYSICS | 1974年 / 45卷 / 08期

关键词：

D O I：

10.1063/1.1663780

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3328 / 3331

页数：4

共 12 条

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[2] STRUCTURE, GROWTH AND ORIENTATION OF VACUUM DEPOSITED TELLURIUM FILMS [J].

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WHITE, M .

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[3] ELECTRICAL PROPERTIES OF VACUUM-DEPOSITED TELLURIUM FILMS [J].

CAPERS, MJ ;

WHITE, M .

THIN SOLID FILMS, 1973, 15 (01) :5-14

[4]

DEOKAR VD, 1966, BASIC PROBLEMS THIN

[5] ELECTRICAL PROPERTIES OF TELLURIUM THIN FILMS [J].

DUTTON, RW ;

MULLER, RS .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1971, 59 (10) :1511-+

[6]

DUTTON RW, 1972, THIN SOLID FILMS, V11, P237

[7]

DUTTON RW, 1970, THESIS U CALIFORNIA

[8]

FUKUROI T, 1949, SCI REPTS RES I TOHO, V1, P365

[9] VARIATION OF FIELD EFFECT MOBILITY AND HALL EFFECT MOBILITY WITH THE THICKNESS OF THE DEPOSITED FILMS OF TELLURIUM [J].

GHOSH, SK .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1961, 19 (1-2) :61-65

[10]

GRAEFFE R, 1966, STATE I TECH RES, V111

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