APPLICATION OF REFLECTION HOLOGRAPHY TO DEFORMATION MEASUREMENT PROBLEMS

被引:7
作者
ENNOS, AE
VIRDEE, MS
机构
关键词
D O I
10.1007/BF02326358
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:202 / 209
页数:8
相关论文
共 9 条
[1]   SANDWICH HOLOGRAM INTERFEROMETRY - NEW DIMENSION IN HOLOGRAPHIC COMPARISON [J].
ABRAMSON, N .
APPLIED OPTICS, 1974, 13 (09) :2019-2025
[2]   SYNTHESIS OF HOLOGRAPHY AND SPECKLE PHOTOGRAPHY TO MEASURE 3-D DISPLACEMENTS [J].
ADAMS, FD ;
MADDUX, GE .
APPLIED OPTICS, 1974, 13 (02) :219-219
[3]  
Archbold E., 1974, Journal of Strain Analysis, V9, P10, DOI 10.1243/03093247V091010
[4]  
BENTON SA, 1979, HDB OPTICAL HOLOGRAP, P349
[5]   USE OF REFLECTION HOLOGRAMS IN HOLOGRAPHIC INTERFEROMETRY AND SPECKLE CORRELATION FOR MEASUREMENT OF SURFACE-DISPLACEMENT [J].
BOONE, PM .
OPTICA ACTA, 1975, 22 (07) :579-589
[6]  
ENNOS AE, 1981, P IUTAM S OPTICAL ME, P331
[7]   OFF-TABLE HOLOGRAPHY [J].
NEUMANN, DB ;
PENN, RC .
EXPERIMENTAL MECHANICS, 1975, 15 (06) :241-244
[8]  
TIMOSHENKO S, 1934, THEORY ELASTICITY, P333
[9]  
WATERS JP, 1974, HOLOGRAPHIC NONDESTR, P229