A REVIEW OF FAULT-TOLERANT TECHNIQUES FOR THE ENHANCEMENT OF INTEGRATED-CIRCUIT YIELD

被引:44
作者
MOORE, WR
机构
[1] Oxford Univ, Engl, Oxford Univ, Engl
关键词
D O I
10.1109/PROC.1986.13531
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
INTEGRATED CIRCUITS
引用
收藏
页码:684 / 698
页数:15
相关论文
共 186 条
[91]  
MADAHAR AK, 1985, THESIS SOUTHAMPTON U
[92]  
MALY W, 1984, P ICCAD 1984, P161
[94]  
MANGIR TE, 1982, IEEE T COMPUT, V31, P609, DOI 10.1109/TC.1982.1676058
[95]  
MANGIR TE, 1985, P IEEE 2, V72, P1687
[96]  
MANNING FB, 1977, IEEE T COMPUT, V26, P536, DOI 10.1109/TC.1977.1674879
[97]  
MANO T, 1982, IEEE J SOLID STATE C, V1, P726
[98]  
MANO T, 1982, FEB P IEEE INT SOL S, P234
[99]  
MASHIKO K, 1984, FEB ISSCC, P98
[100]  
MASUDA I, 1983, FEB P IEEE INT SOL S, P138