DEPTH SELECTIVE X-RAY-ABSORPTION FINE-STRUCTURE SPECTROMETRY

被引：33

作者：

KAWAI, J

ADACHI, H

HAYAKAWA, S

ZHEN, SY

KOBAYASHI, K

GOHSHI, Y

MAEDA, K

KITAJIMA, Y

机构：

[1] UNIV TOKYO,DEPT IND CHEM,BUNKYO KU,TOKYO 113,JAPAN

[2] INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN

[3] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1994年 / 49卷 / 07期

关键词：

D O I：

10.1016/0584-8547(94)80065-0

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Depth selective X-ray absorption fine structure (XAFS) spectrometry is proposed. Recording both the total electron yield (TEY) and the X-ray fluroescence yield (XFY) XAFS concurrently, makes it possible to obtain surface (10-100 angstrom) and bulk chemical information on powder sample. An example is presented for X-ray fluorescent powder sample.

引用

收藏

页码：739 / 743

页数：5

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