X-RAY-INVESTIGATIONS OF SUBMICROMETER LAYER HETEROSTRUCTURES

被引：6

作者：

GOLOVIN, AL ^{[1
]}

PIETSCH, U ^{[1
]}

机构：

[1] KARL MARX UNIV,SEKT PHYS,ARBEITSGEMEINSCH A3 B5 HALBLEITER,DDR-7010 LEIPZIG,GER DEM REP

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1986年 / 96卷 / 02期

关键词：

D O I：

10.1002/pssa.2210960243

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K111 / K115

页数：5

共 7 条

[1]

BRUMMER O, 1976, PHYS STATUS SOLIDI A, V37, P529, DOI 10.1002/pssa.2210370222

[2] RUTHERFORD BACKSCATTERING CHANNELING ANALYSES OF LATTICE-MATCHED CA0.43SR0.57F2 FILMS ON GAAS [J].

FLAGMEYER, R ;

SCHUMANN, B .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 93 (02) :K117-K121

[3] INVESTIGATION OF THE X-RAY-SCATTERING INTENSITY FOR THE LAUE-CASE DIFFRACTION UNDER TOTAL-EXTERNAL-REFLECTION CONDITIONS [J].

GOLOVIN, AL ;

IMAMOV, RM .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 77 (01) :K91-K94

[4]

Imamov R. M., 1983, Proceedings of the International Ion Engineering Congress. The 7th Symposium (1983 International) on Ion Sources and Ion Assisted Technology (ISIAT '83) and the 4th International Conference on Ion and Plasma Assisted Techniques (IPAT '83), P1913

[5] X-RAY TOTAL-EXTERNAL-REFLECTION-BRAGG DIFFRACTION - STRUCTURAL STUDY OF THE GAAS-AL INTERFACE [J].

MARRA, WC ;

EISENBERGER, P ;

CHO, AY .

JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) :6927-6933

[6]

PIETSCH U, UNPUB J APPL CRYST

[7]

SCHUMANN B, J CRYSTAL GROWTH

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