OSCILLATOR-STRENGTH PARAMETERIZATION OF INNER-SHELL CROSS-SECTIONS

被引:29
作者
EGERTON, RF
机构
[1] Physics Department, University of Alberta, Edmonton
关键词
D O I
10.1016/0304-3991(93)90087-E
中图分类号
TH742 [显微镜];
学科分类号
摘要
We present a compilation of dipole oscillator strengths f(DELTA) for ionization of K, L, M, N and O atomic shells, integrated over an energy range DELTA (typically 100 eV) above the ionization threshold. The information was derived from Hartree-Slater calculations, photoabsorption data and measurements by electron energy-loss spectroscopy (EELS). In the case of M-, N- and O-edges, experimental values considerably exceed the Hartree-Slater predictions. From an assessment of the data, we suggest values of f(DELTA) for use in elemental analysis by EELS in the transmission electron microscope.
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页码:13 / 28
页数:16
相关论文
共 46 条
  • [1] INNER SHELL EDGE PROFILES IN ELECTRON-ENERGY LOSS SPECTROSCOPY
    AHN, CC
    REZ, P
    [J]. ULTRAMICROSCOPY, 1985, 17 (02) : 105 - 115
  • [2] A COMPARISON OF THEORETICAL AND EXPERIMENTAL L-CROSS AND M-CROSS SECTIONS
    AUERHAMMER, J
    REZ, P
    HOFER, F
    [J]. ULTRAMICROSCOPY, 1989, 30 (03) : 365 - 370
  • [3] THE FORWARD X-RAY-SCATTERING FACTOR OF COPPER FROM A SELF-CONSISTENT DATA-BASE
    BARKYOUMB, JH
    MORRISON, TI
    SMITH, DY
    [J]. PHYSICS LETTERS A, 1990, 143 (09) : 462 - 466
  • [4] X-RAY-SCATTERING FACTORS OF METALLIC ALUMINUM CALCULATED FROM A SELF-CONSISTENT X-RAY ATTENUATION DATA-BASE
    BARKYOUMB, JH
    SMITH, DY
    [J]. PHYSICAL REVIEW A, 1990, 41 (09): : 4863 - 4867
  • [5] AEM CHARACTERIZATION OF SINTERED SILICON-NITRIDE WITH YTTRIA AND ALUMINA ADDITIONS
    CHADWICK, MM
    MALIS, TF
    [J]. ULTRAMICROSCOPY, 1989, 31 (02) : 205 - 216
  • [6] MEASUREMENT OF INELASTIC ELECTRON-SCATTERING CROSS-SECTIONS BY ELECTRON ENERGY-LOSS SPECTROSCOPY
    CROZIER, PA
    [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1990, 61 (03): : 311 - 336
  • [7] CUKIER M, 1978, J PHYS LETT-PARIS, V39, pL315, DOI 10.1051/jphyslet:019780039018031500
  • [8] RESONANCES IN NEAR-THRESHOLD X-RAY PHOTOABSORPTION OF INNER SHELLS
    DELGRANDE, NK
    TIRSELL, KG
    SCHNEIDER, MB
    GARRETT, RF
    KNEEDLER, EM
    MANSON, ST
    [J]. JOURNAL DE PHYSIQUE, 1987, 48 (C-9): : 951 - 954
  • [9] QUANTITATIVE-ANALYSIS OF ELECTRON-ENERGY-LOSS SPECTRA
    EGERTON, RF
    [J]. ULTRAMICROSCOPY, 1989, 28 (1-4) : 215 - 225
  • [10] K-SHELL IONIZATION CROSS-SECTIONS FOR USE IN MICROANALYSIS
    EGERTON, RF
    [J]. ULTRAMICROSCOPY, 1979, 4 (02) : 169 - 179