XPS STUDY OF CAO IN SODIUM-SILICATE GLASS

被引：39

作者：

VEAL, BW ^{[1
]}

LAM, DJ ^{[1
]}

PAULIKAS, AP ^{[1
]}

CHING, WY ^{[1
]}

机构：

[1] UNIV MISSOURI,DEPT PHYS,KANSAS CITY,MO 64110

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1982年 / 49卷 / 1-3期

关键词：

D O I：

10.1016/0022-3093(82)90127-2

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：309 / 320

页数：12

共 15 条

[1] XPS MEASUREMENTS AND STRUCTURAL ASPECTS OF SILICATE AND PHOSPHATE-GLASSES [J].

BRUCKNER, R ;

CHUN, HU ;

GORETZKI, H ;

SAMMET, M .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1980, 42 (1-3) :49-60

[2] MICROSCOPIC CALCULATION OF LOCALIZED ELECTRON-STATES IN AN INTRINSIC GLASS [J].

CHING, WY .

PHYSICAL REVIEW LETTERS, 1981, 46 (09) :607-610

[3] AQUEOUS CORROSION OF SODA-SILICA AND SODA-LIME-SILICA GLASS [J].

CLARK, DE ;

DILMORE, MF ;

ETHRIDGE, EC ;

HENCH, LL .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1976, 59 (1-2) :62-65

[4] ELECTRONIC-STRUCTURE AND OPTICAL-PROPERTIES OF OXIDE GLASSES .1. SIO2, NA2O - SIO2 AND NA2O - CAO - SIO2 [J].

ELLIS, E ;

JOHNSON, DW ;

BREEZE, A ;

MAGEE, PM ;

PERKINS, PG .

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1979, 40 (02) :105-124

[5]

Fadley C.S., 1978, ELECTRON SPECTROSCOP, P2

[6] ELECTRONIC-STRUCTURE OF SIO2, SIXGE1-XO2, AND GEO2 FROM PHOTOEMISSION SPECTROSCOPY [J].

FISCHER, B ;

POLLAK, RA ;

DISTEFANO, TH ;

GROBMAN, WD .

PHYSICAL REVIEW B, 1977, 15 (06) :3193-3199

[7]

FISCHER B, 1978, P INT C PHYSICS SIO2

[8]

JEN JS, 1979, J NONCRYST SOLIDS, V38, P21

[9]

LEVIN EM, 1964, AM CERAM SOC, P175

[10]

RAWSON H, 1967, INORGANIC GLASS FORM, P84

← 1 2 →