ELECTRONIC-STRUCTURE OF SIO2, SIXGE1-XO2, AND GEO2 FROM PHOTOEMISSION SPECTROSCOPY

被引：105

作者：

FISCHER, B ^{[1
]}

POLLAK, RA ^{[1
]}

DISTEFANO, TH ^{[1
]}

GROBMAN, WD ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

PHYSICAL REVIEW B | 1977年 / 15卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.15.3193

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：3193 / 3199

页数：7

相关论文

共 42 条

[1] BOHM HF, 1972, J NONCRYST SOLIDS, V7, P192
[2] BND EDGE OF AMORPHOUS SIO2 BY PHOTOINJECTION AND PHOTOCONDUCTIVITY MEASUREMENTS
DISTEFANO, TH
EASTMAN, DE
[J]. SOLID STATE COMMUNICATIONS, 1971, 9 (24) : 2259 - +
[3] IMPACT IONIZATION MODEL FOR DIELECTRIC INSTABILITY AND BREAKDOWN
DISTEFANO, TH
SHATZKES, M
[J]. APPLIED PHYSICS LETTERS, 1974, 25 (12) : 685 - 687
[4] PHOTOEMISSION MEASUREMENTS OF VALENCE LEVELS OF AMORPHOUS SIO2
DISTEFANO, TH
EASTMAN, DE
[J]. PHYSICAL REVIEW LETTERS, 1971, 27 (23) : 1560 - +
[5] CHEMICAL BONDING STUDIES OF SILICATES AND OXIDES BY X-RAY K-EMISSION SPECTROSCOPY
DODD, CG
GLEN, GL
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (12) : 5377 - &
[6] QUASI-ELASTIC ELECTRON-SCATTERING IN EUO - POSSIBLE EXPLANATION FOR OBSERVED PARAMAGNETIC SPIN-POLARIZED PHOTOEMISSION
EASTMAN, DE
[J]. PHYSICAL REVIEW B, 1973, 8 (12): : 6027 - 6029
[7] FISCHER DW, 1970, ADVANCES XRAY ANALYS, V13, P159
[8] CHEMICAL BONDING EFFECTS IN OXYGEN KALPHA X-RAY-EMISSION BANDS OF SILICA
GILBERT, TL
STEVENS, WJ
SCHRENK, H
YOSHIMINE, M
BAGUS, PS
[J]. PHYSICAL REVIEW B, 1973, 8 (12) : 5977 - 5998
[9] A MODEL FOR RADIATION DAMAGE IN METAL-OXIDE-SEMICONDUCTOR STRUCTURES
GROVE, AS
SNOW, EH
[J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (06): : 894 - +
[10] Hughes H. L., 1964, ELECTRONICS, V37, P58

← 1 2 3 4 5 →