MEASUREMENT OF OPTICAL NONLINEARITIES USING AN ELLIPTIC GAUSSIAN-BEAM

被引：10

作者：

MIAN, SM

WICKSTED, JP

机构：

[1] Department of Physics, Center for Laser Research, Oklahoma State University, Stillwater

来源：

JOURNAL OF APPLIED PHYSICS | 1995年 / 77卷 / 10期

关键词：

D O I：

10.1063/1.359236

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have investigated optical nonlinearities using a beam that has a transverse elliptic Gaussian profile. The popular single-beam technique known as Z-scan complimented with optical limiting experiments are analyzed in this study. A geometric optics model including both nonlinear refraction and absorption is developed in the aberration-free approximation. We have found good agreement between theory and experimental data taken from a lead silicate glass where the elliptic beam had an eccentricity of about 0.98. © 1995 American Institute of Physics.

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页码：5434 / 5436

页数：3

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