CONTROL OF CHARGING IN LOW-VOLTAGE SEM

[1] ARNAL F, 1969, CR ACAD SCI B PHYS, V268, P1526

[2] SOME CONSIDERATIONS ON THE ELECTRIC-FIELD INDUCED IN INSULATORS BY ELECTRON-BOMBARDMENT [J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (05) : 1418 - 1430

[3] Frosien J., 1985, Microcircuit Engineering 84. International Conference Proceedings, P441

[4] A MODEL FOR CALCULATING SECONDARY AND BACKSCATTERED ELECTRON YIELDS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1987, 147 : 51 - 64

[5] KRAUSE SJ, 1987, 45TH EMSA, P466

[6] Newbury D.E., 1986, ADV SCANNING ELECT M, P45

[7] SCHAFFNER TJ, 1976, SCANNING ELECTRON MI, P61

[8] SECONDARY-ELECTRON EMISSION IN THE SCANNING ELECTRON-MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) : R1 - R18

[9] SUGIYAMA N, 1986, J ELECTRON MICROSC, V35, P9

[10] VAZ OW, 1986, 44TH P ANN M EL MICR, P676

[1] ARNAL F, 1969, CR ACAD SCI B PHYS, V268, P1526

[2] SOME CONSIDERATIONS ON THE ELECTRIC-FIELD INDUCED IN INSULATORS BY ELECTRON-BOMBARDMENT [J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (05) : 1418 - 1430

[3] Frosien J., 1985, Microcircuit Engineering 84. International Conference Proceedings, P441

[4] A MODEL FOR CALCULATING SECONDARY AND BACKSCATTERED ELECTRON YIELDS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1987, 147 : 51 - 64

[5] KRAUSE SJ, 1987, 45TH EMSA, P466

[6] Newbury D.E., 1986, ADV SCANNING ELECT M, P45

[7] SCHAFFNER TJ, 1976, SCANNING ELECTRON MI, P61

[8] SECONDARY-ELECTRON EMISSION IN THE SCANNING ELECTRON-MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) : R1 - R18

[9] SUGIYAMA N, 1986, J ELECTRON MICROSC, V35, P9

[10] VAZ OW, 1986, 44TH P ANN M EL MICR, P676