INTERFACIAL FREE-ENERGIES FROM SUBSTRATE CURVATURE MEASUREMENTS OF THE CREEP OF MULTILAYER THIN-FILMS

被引:12
作者
JOSELL, D
机构
[1] National Institute of Standards and Technology, Gaithersburg
来源
ACTA METALLURGICA ET MATERIALIA | 1994年 / 42卷 / 03期
关键词
D O I
10.1016/0956-7151(94)90297-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The equilibrium biaxial curvature of a multilayer thin film adhering to a free standing substrate is determined when plastic flow is possible in the multilayer. The relationship found between the equilibrium biaxial curvature and the interfaces in the multilayer is modified to account for grain boundaries in the layers. Two possible experiments that utilize the resulting relationship to determine interfacial free energies are described.
引用
收藏
页码:1031 / 1038
页数:8
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