THE ORTHOGONALIZED PLANE-WAVE METHOD APPLIED TO THE CALCULATION OF DYNAMICAL EFFECTS IN ELECTRON-DIFFRACTION

被引：4

作者：

BARRETEAU, C

DUCASTELLE, F

机构：

[1] Office National d'Etudes et de Recherches Aérospatiales (ONERA), Direction des Matériaux (OM), BP 72

来源：

ULTRAMICROSCOPY | 1995年 / 57卷 / 01期

关键词：

D O I：

10.1016/0304-3991(94)00168-M

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

It is shown that the orthogonalized plane-wave method can greatly simplify the calculations of dynamical electron diffraction by reducing considerably the size of the dynamical matrix.

引用

页码：11 / 15

页数：5

共 24 条

[11] SYMMETRIES AND BEAM REDUCTION IN THE MATRIX FORMULATION OF THE DYNAMICAL THEORY OF FAST ELECTRONS [J].

GRATIAS, D ;

CORNIER, M ;

PORTIER, R .

ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 :789-798

[12]

HARRISON WA, 1980, SOLID STATE PHYSICS

[13]

HUMPHREYS CJ, 1992, ELECTRON DIFFRACTION, V1, pCH2

[14] COMMENTS ON THE COMPUTATION OF ELECTRON WAVE-PROPAGATION IN THE SLICE METHODS [J].

ISHIKUZA, K .

JOURNAL OF MICROSCOPY-OXFORD, 1985, 137 (MAR) :233-239

[15] NEW THEORETICAL AND PRACTICAL APPROACH TO MULTISLICE METHOD [J].

ISHIZUKA, K ;

UYEDA, N .

ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (SEP1) :740-749

[16]

KAMBE K, 1974, Z NATURFORSCH A, VA 29, P1034

[17] VISUALIZATION OF BLOCH WAVES OF HIGH-ENERGY ELECTRONS IN HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].

KAMBE, K .

ULTRAMICROSCOPY, 1982, 10 (03) :223-227

[18]

PORTIER R, 1991, MICROSCOPIE ELECTRON

[19] PRACTICAL COMPUTATION OF AMPLITUDES AND PHASES IN ELECTRON-DIFFRACTION [J].

SELF, PG ;

OKEEFE, MA ;

BUSECK, PR ;

SPARGO, AEC .

ULTRAMICROSCOPY, 1983, 11 (01) :35-52

[20] DEPENDENCE OF ZONE AXIS PATTERNS ON STRING INTEGRALS OR NUMBER OF BOUND-STATES IN HIGH-ENERGY ELECTRON-DIFFRACTION [J].

STEEDS, JW ;

JONES, PM ;

LOVELUCK, JE ;

COOKE, K .

PHILOSOPHICAL MAGAZINE, 1977, 36 (02) :309-322

← 1 2 3 →