X-RAY-SCATTERING FROM ROTATIONAL DISORDER IN EPITAXIAL-FILMS - AN UNCONVENTIONAL MOSAIC CRYSTAL

被引：104

作者：

MICELI, PF ^{[1
]}

PALMSTROM, CJ ^{[1
]}

机构：

[1] BELLCORE,RED BANK,NJ 07701

来源：

PHYSICAL REVIEW B | 1995年 / 51卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.51.5506

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Motivated by x-ray-scattering measurements performed on ErAs(001)/GaAs(001) and In0.7Ga0.3P(001)/GaAs(001), we present a model that explains the origin of a narrow peak and diffuse scattering, which are frequently observed at Bragg reflections in epitaxial systems. Central to the model is a correlation length for mosaiclike rotational disorder that arises in lattice-mismatched epitaxial films. The adhesive force between the film and the substrate is found to play a crucial role and leads to a striking anisotropy in the line shapes. © 1995 The American Physical Society.

引用

页码：5506 / 5509

页数：4