STRAINED-LAYER MULTIQUANTUM BARRIERS FOR REDUCING HOT-ELECTRON LEAKAGE IN LONG-WAVELENGTH SEMICONDUCTOR-LASERS

被引:9
作者
IRIKAWA, M [1 ]
SASAKI, Y [1 ]
IWASE, M [1 ]
IGA, K [1 ]
机构
[1] TOKYO INST TECHNOL, MIDORI KU, YOKOHAMA, KANAGAWA 227, JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1992年 / 31卷 / 9B期
关键词
LASER DIODE; OVERFLOW LEAKAGE; HOT ELECTRON; ELECTRON WAVE CONFINEMENT; MULTIQUANTUM BARRIER; TENSILE-STRAINED ALLNAS;
D O I
10.1143/JJAP.31.L1351
中图分类号
O59 [应用物理学];
学科分类号
摘要
Multi-quantum barriers with a 1%-tensile-strained AlInAs/GaInAsP system are proposed for the purpose of suppressing the overflow leakage of hot electrons generated by the Auger effect. It is theoretically demonstrated for the first time that an effective barrier height of 1.2 eV, which is sufficient to confine hot electrons, can be obtained for 1.3 mum GaInAsP lasers. This implies that the overflow is almost suppressed, and dramatic improvement of high-temperature operation is expected.
引用
收藏
页码:L1351 / L1354
页数:4
相关论文
共 24 条
[1]  
AGRAWAL GP, 1990, LONG WAVELENGTH SEMI, pCH3
[2]  
ARIMOTO S, 1992, TECHNICAL DIGEST SER, V12, P2
[3]   GA-AL-IN-AS TERNARY AND QUATERNARY ALLOYS LATTICE MATCHED TO INP FOR ELECTRONIC, OPTOELECTRONIC AND OPTICAL-DEVICE APPLICATIONS, BY LP-MOVPE [J].
DAVIES, JI ;
MARSHALL, AC ;
SCOTT, MD ;
GRIFFITHS, RJM .
JOURNAL OF CRYSTAL GROWTH, 1988, 93 (1-4) :782-791
[4]   THE CASE FOR AUGER RECOMBINATION IN IN1-XGAXASYP1-Y [J].
DUTTA, NK ;
NELSON, RJ .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (01) :74-92
[5]   RELATIONSHIP BETWEEN THE CONDUCTION-BAND DISCONTINUITIES AND BAND-GAP DIFFERENCES OF INGAASP/INP HETEROJUNCTIONS [J].
FORREST, SR ;
SCHMIDT, PH ;
WILSON, RB ;
KAPLAN, ML .
APPLIED PHYSICS LETTERS, 1984, 45 (11) :1199-1201
[6]   ELECTRON REFLECTANCE OF MULTIQUANTUM BARRIER (MQB) [J].
IGA, K ;
UENOHARA, H ;
KOYAMA, F .
ELECTRONICS LETTERS, 1986, 22 (19) :1008-1010
[7]  
IGA K, 1992, TECHNICAL DIGEST SER, V12, P2
[8]   SOLVING THE SCHRODINGER-EQUATION IN ARBITRARY QUANTUM-WELL POTENTIAL PROFILES USING THE TRANSFER-MATRIX METHOD [J].
JONSSON, B ;
ENG, ST .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1990, 26 (11) :2025-2035
[9]  
KIKUCHI A, 1991, IEICE JPN ED, V91, P315
[10]  
KISHINO K, 12TH IEEE INT LAS C, P21