ONLINE DATA REDUCTION WITH A PRISM SPECTROMETER

[1] DIRECT OBSERVATION OF E0 AND E0 + DELTA0 TRANSITIONS IN SILICON [J]. SOLID STATE COMMUNICATIONS, 1972, 11 (10) : 1375 - &

[2] ASPNES DE, ENCYCLOPEDIC DICTION

[3] A SENSITIVE SINGLE BEAM DEVICE FOR CONTINUOUS REFLECTANCE OR TRANSMITTANCE MEASUREMENTS [J]. APPLIED OPTICS, 1968, 7 (11): : 2218 - &

[4] PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (01) : 1 - 6

[5] BOTTKA N, COMMUNICATION

[6] CARDONA M, 1968, MODULATION SPECTROSC, P101

[7] DECKER DL, UNPUBLISHED

[8] OPTICAL PROPERTIES OF AMORPHOUS GERMANIUM FILMS [J]. PHYSICAL REVIEW B, 1970, 2 (02): : 397 - &

[9] Fischer J. E., 1972, Comments on Solid State Physics, V5, P1

[10] Fischer J. E., 1971, Optics Communications, V3, P116, DOI 10.1016/0030-4018(71)90192-1

[1] DIRECT OBSERVATION OF E0 AND E0 + DELTA0 TRANSITIONS IN SILICON [J]. SOLID STATE COMMUNICATIONS, 1972, 11 (10) : 1375 - &

[2] ASPNES DE, ENCYCLOPEDIC DICTION

[3] A SENSITIVE SINGLE BEAM DEVICE FOR CONTINUOUS REFLECTANCE OR TRANSMITTANCE MEASUREMENTS [J]. APPLIED OPTICS, 1968, 7 (11): : 2218 - &

[4] PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (01) : 1 - 6

[5] BOTTKA N, COMMUNICATION

[6] CARDONA M, 1968, MODULATION SPECTROSC, P101

[7] DECKER DL, UNPUBLISHED

[8] OPTICAL PROPERTIES OF AMORPHOUS GERMANIUM FILMS [J]. PHYSICAL REVIEW B, 1970, 2 (02): : 397 - &

[9] Fischer J. E., 1972, Comments on Solid State Physics, V5, P1

[10] Fischer J. E., 1971, Optics Communications, V3, P116, DOI 10.1016/0030-4018(71)90192-1