TECHNIQUES IN APPLIED ELECTRON MICROSCOPY

[1] Bright diffraction gratings [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1944, 34 (01) : 1 - 5

[2] Boersch H, 1943, PHYS Z, V44, P202

[3] Busch H, 1926, ANN PHYS-BERLIN, V81, P974

[4] Fine structure of metallic surfaces with the electron microscope [J]. JOURNAL OF APPLIED PHYSICS, 1943, 14 (01) : 23 - 29

[5] CRYSTAL INTERFERENCE PHENOMENA IN ELECTRON MICROSCOPE IMAGES [J]. JOURNAL OF APPLIED PHYSICS, 1945, 16 (02) : 97 - 105

[6] Interpretation of electron micrographs of silica surface replicas [J]. JOURNAL OF APPLIED PHYSICS, 1943, 14 (07) : 312 - 320

[7] Electron microscopic determination of surface elevations and orientations [J]. JOURNAL OF APPLIED PHYSICS, 1944, 15 (05) : 423 - 435

[8] A discussion of the fundamental limit of performance of an electron microscope [J]. PHYSICAL REVIEW, 1941, 60 (10): : 743 - 745

[9] HILLIER J, 1942, B ASTM, V117, P15

[10] HILLIER JAMES, 1939, CANADIAN JOUR RES SECT A PHYS SCI, V17, P64

[1] Bright diffraction gratings [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1944, 34 (01) : 1 - 5

[2] Boersch H, 1943, PHYS Z, V44, P202

[3] Busch H, 1926, ANN PHYS-BERLIN, V81, P974

[4] Fine structure of metallic surfaces with the electron microscope [J]. JOURNAL OF APPLIED PHYSICS, 1943, 14 (01) : 23 - 29

[5] CRYSTAL INTERFERENCE PHENOMENA IN ELECTRON MICROSCOPE IMAGES [J]. JOURNAL OF APPLIED PHYSICS, 1945, 16 (02) : 97 - 105

[6] Interpretation of electron micrographs of silica surface replicas [J]. JOURNAL OF APPLIED PHYSICS, 1943, 14 (07) : 312 - 320

[7] Electron microscopic determination of surface elevations and orientations [J]. JOURNAL OF APPLIED PHYSICS, 1944, 15 (05) : 423 - 435

[8] A discussion of the fundamental limit of performance of an electron microscope [J]. PHYSICAL REVIEW, 1941, 60 (10): : 743 - 745

[9] HILLIER J, 1942, B ASTM, V117, P15

[10] HILLIER JAMES, 1939, CANADIAN JOUR RES SECT A PHYS SCI, V17, P64