Electron microscopic determination of surface elevations and orientations

被引：38

作者：

Heidenreich, RD ^{[1
]}

Matheson, LA ^{[1
]}

机构：

[1] Dow Chem Co, Midland, MI USA

来源：

关键词：

D O I：

10.1063/1.1707450

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：423 / 435

页数：13

共 19 条

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[5] EITEL W, 1940, NATURWISSENSCHAFTEN, V28, P367
[6] GOLZ E, 1943, Z TECH PHYS, V24, P8
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Heidenreich, RD
Peck, VG
[J]. JOURNAL OF APPLIED PHYSICS, 1943, 14 (01) : 23 - 29
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Heidenreich, RD
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Heidenreich, RD
[J]. JOURNAL OF APPLIED PHYSICS, 1943, 14 (07) : 312 - 320
[10] The observation of crystalline reflections in electron microscope images
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Baker, RF
[J]. PHYSICAL REVIEW, 1942, 61 (11/12): : 722 - 723