STRUCTURAL CHARACTERIZATION OF CD(SE, S)-DOPED GLASSES

被引：8

作者：

FAGHERAZZI, G ^{[1
]}

RIELLO, P ^{[1
]}

RIGHINI, GC ^{[1
]}

机构：

[1] CNR,IST RIC ONDE ELETTROMAGNET,I-50127 FLORENCE,ITALY

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1992年 / 142卷 / 1-2期

关键词：

D O I：

10.1016/S0022-3093(05)80007-9

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Two Cd(Se, S)-doped glasses, one richer in selenium and the other richer in sulphur, were examined by X-ray scattering (at high and at small angles) in order to determine with high precision the stoichiometry of the microcrystalline phase as well as the crystallite/particle average size and size distribution. The peak profile broadening analysis, carried out by best-fitting methods, has shown the presence of microstrains inside the dispersed crystalline particles. This result agrees with very recent HRTEM observations. Particle sizes, as determined by SAXS, are shown to agree very well with the corresponding ones determined by SANS.

引用

页码：63 / 69

页数：7

共 18 条

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