STRUCTURE-ANALYSIS OF THE NISI2/(111)SI INTERFACE BY THE X-RAY STANDING WAVE METHOD

被引：4

作者：

AKIMOTO, K ^{[1
]}

ISHIKAWA, T ^{[1
]}

TAKAHASHI, T ^{[1
]}

KIKUTA, S ^{[1
]}

机构：

[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,OHO,IBARAKI 305,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1986年 / 246卷 / 1-3期

关键词：

D O I：

10.1016/0168-9002(86)90185-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：755 / 759

页数：5

共 9 条

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[2] STRUCTURAL-ANALYSIS OF THE NISI2/(111)SI INTERFACE BY THE X-RAY STANDING-WAVE METHOD [J].

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ISHIKAWA, T ;

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KIKUTA, S .

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[4] ATOMIC-STRUCTURE OF THE NISI2/(111)SI INTERFACE [J].

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SPENCE, JCH .

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[5] X-RAY STANDING WAVES AT CRYSTAL-SURFACES [J].

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[6]

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[7] OBSERVATION OF INTERNAL X-RAY WAVE FIELDS DURING BRAGG-DIFFRACTION WITH AN APPLICATION TO IMPURITY LATTICE LOCATION [J].

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BROWN, WL .

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[8] PHOTOEMISSION IN BRAGG-DIFFRACTION OF X-RAYS BY BICRYSTALS [J].

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[9]

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