STRUCTURAL-ANALYSIS OF THE NISI2/(111)SI INTERFACE BY THE X-RAY STANDING-WAVE METHOD

被引:18
作者
AKIMOTO, K [1 ]
ISHIKAWA, T [1 ]
TAKAHASHI, T [1 ]
KIKUTA, S [1 ]
机构
[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,IBARAKI 305,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1985年 / 24卷 / 11期
关键词
D O I
10.1143/JJAP.24.1425
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:1425 / 1431
页数:7
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