CHEMICAL-BOND AND RELATED PROPERTIES OF SIO2 .7. STRUCTURE AND ELECTRONIC PROPERTIES OF THE SIOX REGION OF SI-SIO2 INTERFACES

被引：76

作者：

HUBNER, K

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1980年 / 61卷 / 02期

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D O I：

10.1002/pssa.2210610241

中图分类号：

T [工业技术];

学科分类号：

08 ;

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页码：665 / 673

页数：9

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