HYBRID OPTICAL AND ELECTRONIC IMAGE-PROCESSING FOR STRAIN-MEASUREMENTS BY SPECKLE PHOTOGRAPHY

[1] DISPLACEMENT MEASUREMENT FROM DOUBLE-EXPOSURE LASER PHOTOGRAPHS [J]. OPTICA ACTA, 1972, 19 (04): : 253 - &

[2] ARCHBOLD E, 1978, 1ST EUR C OPT APPL M, V136, P258

[3] Ennos A. E., 1975, Laser speckle and related phenomena, P203

[4] MADDUX GE, 1978, TM78109FBE AFFDL WRI

[5] Stetson K. A., 1978, 6th International Conference on Experimental Stress Analysis, P149

[6] VULNERABILITY OF SPECKLE PHOTOGRAPHY TO LENS ABERRATIONS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (11) : 1587 - 1590

[7] PROBLEM OF DEFOCUSING IN SPECKLE PHOTOGRAPHY, ITS CONNECTION TO HOLOGRAM INTERFEROMETRY, AND ITS SOLUTIONS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (11) : 1267 - 1271

[1] DISPLACEMENT MEASUREMENT FROM DOUBLE-EXPOSURE LASER PHOTOGRAPHS [J]. OPTICA ACTA, 1972, 19 (04): : 253 - &

[2] ARCHBOLD E, 1978, 1ST EUR C OPT APPL M, V136, P258

[3] Ennos A. E., 1975, Laser speckle and related phenomena, P203

[4] MADDUX GE, 1978, TM78109FBE AFFDL WRI

[5] Stetson K. A., 1978, 6th International Conference on Experimental Stress Analysis, P149

[6] VULNERABILITY OF SPECKLE PHOTOGRAPHY TO LENS ABERRATIONS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (11) : 1587 - 1590

[7] PROBLEM OF DEFOCUSING IN SPECKLE PHOTOGRAPHY, ITS CONNECTION TO HOLOGRAM INTERFEROMETRY, AND ITS SOLUTIONS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (11) : 1267 - 1271