ANALYSIS OF TIN DIOXIDE COATINGS BY MULTIPLE ANGLE OF INCIDENCE ELLIPSOMETRY

被引：22

作者：

HAITJEMA, H

WOERLEE, GF

机构：

来源：

THIN SOLID FILMS | 1989年 / 169卷 / 01期

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D O I：

10.1016/S0040-6090(89)80002-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

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页码：1 / 16

页数：16

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共 17 条

[1] ABRAMOWITZ M, 1970, HDB MATH FUNCTIONS, P310
[2] Azzam R. M. A., 1977, ELLIPSOMETRY POLARIZ
[3] Bevington P. R., 1969, DATA REDUCTION ERROR, P154
[4] BRUGGEMAN DAG, 1935, ANN PHYS LPZ, V24, P635
[5] MULTIPLE-ANGLE ELLIPSOMETRY OF SI-SIO2 POLYCRYSTALLINE SI SYSTEM
GAILLYOVA, Y
SCHMIDT, E
HUMLICEK, J
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1985, 2 (05) : 723 - 726
[6] PREPARATION AND GROWTH OF SNO2 THIN-FILMS AND THEIR OPTICAL AND ELECTRICAL-PROPERTIES
GROSSE, P
SCHMITTE, FJ
FRANK, G
KOSTLIN, H
[J]. THIN SOLID FILMS, 1982, 90 (03) : 309 - 315
[7] THE PHYSICAL-PROPERTIES OF FLUORINE-DOPED TIN DIOXIDE FILMS AND THE INFLUENCE OF AGING AND IMPURITY EFFECTS
HAITJEMA, H
ELICH, J
[J]. SOLAR ENERGY MATERIALS, 1987, 16 (1-3): : 79 - 90
[8] SENSITIVITY EXTREMA IN MULTIPLE-ANGLE ELLIPSOMETRY
HUMLICEK, J
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1985, 2 (05) : 713 - 722
[9] PARAMETER-CORRELATION AND COMPUTATIONAL CONSIDERATIONS IN MULTIPLE-ANGLE ELLIPSOMETRY
IBRAHIM, MM
BASHARA, NM
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (12) : 1622 - &
[10] INFLUENCE OF SPRAY CONDITIONS AND DOPANTS ON HIGHLY CONDUCTING TIN DIOXIDE FILMS
KARLSSON, T
ROOS, A
RIBBING, CG
[J]. SOLAR ENERGY MATERIALS, 1985, 11 (5-6): : 469 - 478