COMPARISON OF METHODS FOR ACCURATE FILM THICKNESS MEASUREMENT

被引:17
作者
KING, RJ
DOWNS, MJ
TALIM, SP
RAINE, KW
CLAPHAM, PB
机构
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1972年 / 5卷 / 05期
关键词
D O I
10.1088/0022-3735/5/5/021
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
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页码:445 / &
相关论文
共 8 条
[1]  
Bennet H.E., 1967, PHYS THIN FILMS, V4, P1
[2]   EFFECT OF POLISHING TECHNIQUE ON ROUGHNESS AND RESIDUAL SURFACE FILM ON FUSED QUARTZ OPTICAL FLATS [J].
BENNETT, JM ;
KING, RJ .
APPLIED OPTICS, 1970, 9 (01) :236-&
[3]   VERY PRECISE THICKNESS MEASUREMENT OF THIN FILMS [J].
DYSON, J .
NATURE, 1963, 197 (487) :1193-&
[4]  
Dyson J., 1970, INTERFEROMETRY MEASU
[5]   FILM THICKNESS MEASUREMENT BY ABSOLUTE METHODS [J].
GREAVES, C .
VACUUM, 1970, 20 (10) :437-&
[6]   A SIMPLE SCATTER METHOD FOR OPTICAL SURFACE ROUGHNESS AND SLOPE MEASUREMENTS - ROUGHNESS OF POLISHED FUSED SILICA [J].
HODGKINS.IJ .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (05) :341-&
[7]   APPLICATION OF FRINGES OF EQUAL CHROMATIC ORDER TO ASSESSMENT OF SURFACE ROUGHNESS OF POLISHED FUSED SILICA [J].
HODGKINSON, IJ .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (04) :300-+
[8]  
Tolansky S., 1960, SURFACE MICROTOPOGRA, V1st