EFFECT OF ATOMIC NUMBER IN ELECTRON-PROBE MICROANALYSIS OF COPPER-NICKEL ALLOYS

被引：4

作者：

RANZETTA, GV

SCOTT, VD

机构：

来源：

BRITISH JOURNAL OF APPLIED PHYSICS | 1967年 / 18卷 / 10期

关键词：

D O I：

10.1088/0508-3443/18/10/305

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1403 / &

共 9 条

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MULVEY, T
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[3] BACK SCATTERING OF ELECTRONS
ARCHARD, GD
[J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (08) : 1505 - &
[4] BIRKS LS, 1963, ELECTRON PROBE MICRO, P109
[5] CASTAING R, 1952, ONERA PUBL, P55
[6] PRESENT STATE OF QUANTITATIVE X-RAY MICROANALYSIS .1. PHYSICAL BASIS
DUNCUMB, P
SHIELDS, PK
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (10): : 617 - &
[7] SPECIMEN CONTAMINATION IN ELECTRON-PROBE MICROANALYSIS AND ITS PREVENTION USING A COLD TRAP
RANZETTA, GV
SCOTT, VD
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1966, 43 (11): : 816 - &
[8] ELECTRON-PROBE MICROANALYSIS OF LOW ATOMIC NUMBER ELEMENTS
RANZETTA, GV
SCOTT, VD
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1964, 15 (03): : 263 - &
[9] SCOTT VD, 1961, J I METALS, V90, P163