A METHOD TO ELIMINATE WETTING DURING THE HOMOGENIZATION OF HGCDTE

被引:10
作者
SU, CH
LEHOCZKY, SL
SZOFRAN, FR
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D O I
10.1063/1.337541
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O59 [应用物理学];
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页码:3777 / 3779
页数:3
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[1]  
BREBRICK RF, 1983, SEMICONDUCT SEMIMET, V19, pCH3
[2]   DEFECT STRUCTURE OF CDTE - HALL DATA [J].
CHERN, SS ;
VYDYANATH, HR ;
KROGER, FA .
JOURNAL OF SOLID STATE CHEMISTRY, 1975, 14 (01) :33-43
[3]   STATUS OF POINT-DEFECTS IN HGCDTE [J].
JONES, CE ;
JAMES, K ;
MERZ, J ;
BRAUNSTEIN, R ;
BURD, M ;
EETEMADI, M ;
HUTTON, S ;
DRUMHELLER, J .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (01) :131-137
[4]   PARTIAL PRESSURES OVER HGTE-CDTE SOLID-SOLUTIONS .1. CALIBRATION EXPERIMENTS AND RESULTS FOR 41.6 MOLE PERCENT CDTE [J].
SCHWARTZ, JP ;
TUNG, T ;
BREBRICK, RF .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (02) :438-451
[5]   ELECTRICALLY ACTIVE POINT DEFECTS IN CADMIUM TELLURIDE [J].
SMITH, FTJ .
METALLURGICAL TRANSACTIONS, 1970, 1 (03) :617-&
[6]  
Su C.-W., UNPUB
[7]   PARTIAL PRESSURES OVER THE PSEUDOBINARY SOLID-SOLUTION HG1-XCDXTE(S) FOR X = 0.70 AND 0.95 AND OVER 4 TE-RICH TERNARY MELTS [J].
SU, CH ;
LIAO, PK ;
BREBRICK, RF .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (04) :942-949
[8]   DEFECT CHEMISTRY AND INTRINSIC CARRIER CONCENTRATION FOR HG1-XCDXTE(S) FOR X = 0.20, 0.40, AND 1.0 [J].
SU, CH ;
LIAO, PK ;
BREBRICK, RF .
JOURNAL OF ELECTRONIC MATERIALS, 1983, 12 (05) :771-826
[9]   THE PSEUDOBINARY HGTE-CDTE PHASE-DIAGRAM [J].
SZOFRAN, FR ;
LEHOCZKY, SL .
JOURNAL OF ELECTRONIC MATERIALS, 1981, 10 (06) :1131-1150
[10]   GROWTH BY TRAVELING HEATER METHOD AND CHARACTERISTIC OF UNDOPED HIGH-RESISTIVITY CDTE [J].
TAGUCHI, T ;
SHIRAFUJI, J ;
INUISHI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 (08) :1331-1342