SENSITIVE CONTACTLESS EDDY-CURRENT CONDUCTIVITY MEASUREMENTS ON SI AND HGCDTE

被引：12

作者：

CHEN, MC

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 06期

关键词：

D O I：

10.1063/1.1140326

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1116 / 1122

页数：7

共 11 条

[1]

BIANCHI G, 1985, MANUFACTURING TECHNO

[2] INHOMOGENEITY MODEL FOR ANOMALOUS HALL-EFFECTS IN N-TYPE HG0.8CD0.2 TE LIQUID-PHASE-EPITAXY FILMS [J].

CHEN, MC ;

PARKER, SG ;

WEIRAUCH, DF .

JOURNAL OF APPLIED PHYSICS, 1985, 58 (08) :3150-3153

[3] CONTACTLESS METHOD OF MEASURING RESISTIVITY [J].

CROWLEY, JD ;

RABSON, TA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (06) :712-715

[4]

HORIGUCHI F, 1978, JPN J APPL PHYS, V18, P165

[5]

JONES CE, 1986, J VAC SCI TECHNOL A, V4, P2058

[6]

Lorrain P., 1988, ELECTROMAGNETIC FIEL

[7]

MCCLUNG RW, 1974, ANN REV MATERIALS SC, V4, P1

[8] CONTACTLESS MEASUREMENT OF SEMICONDUCTOR CONDUCTIVITY BY RADIO FREQUENCY-FREE-CARRIER POWER ABSORPTION [J].

MILLER, GL ;

ROBINSON, DAH ;

WILEY, JD .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (07) :799-805

[9]

Murakami I., 1982, Transactions of the Institute of Electronics and Communication Engineers of Japan, Section E (English), VE65, P492

[10] INDUCTION MEASUREMENT OF SEMICONDUCTOR + THIN-FILM RESISTIVITY [J].

POEHLER, TO ;

LIBEN, W .

PROCEEDINGS OF THE IEEE, 1964, 52 (06) :731-&

← 1 2 →