REINVESTIGATION OF THE STRUCTURE OF SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG SURFACE

被引：18

作者：

KONO, S

ABUKAWA, T

NAKAMURA, N

ANNO, K

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1989年 / 28卷 / 07期

关键词：

D O I：

10.1143/JJAP.28.L1278

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L1278 / L1281

页数：4

共 15 条

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[6] X-RAY PHOTOELECTRON DIFFRACTION STUDY OF THE ATOMIC GEOMETRY OF THE SI(111) SQUARE-ROOT3 X SQUARE-ROOT3-AG SURFACE [J].

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[7] SURFACE AND BULK CORE-LEVEL SHIFTS OF THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG SURFACE - EVIDENCE FOR A CHARGED SQUARE-ROOT-3 X SQUARE-ROOT-3 LAYER [J].

KONO, S ;

HIGASHIYAMA, K ;

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[8] DOPANT REDISTRIBUTION AT SI SURFACES DURING VACUUM ANNEAL [J].

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[9] SI(111)-(SQUARE-ROOT-3XSQUARE-ROOT-3) AG SURFACE-STRUCTURE STUDIED BY IMPACT-COLLISION ION-SCATTERING SPECTROMETRY [J].

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PHYSICAL REVIEW LETTERS, 1988, 60 (17) :1739-1742

[10] STUDY ON THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG SURFACE-STRUCTURE BY X-RAY-DIFFRACTION [J].

TAKAHASHI, T ;

NAKATANI, S ;

OKAMOTO, N ;

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JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (05) :L753-L755

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