DOPANT REDISTRIBUTION AT SI SURFACES DURING VACUUM ANNEAL

被引:48
作者
LIEHR, M
RENIER, M
WACHNIK, RA
SCILLA, GS
机构
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D O I
10.1063/1.338372
中图分类号
O59 [应用物理学];
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页码:4619 / 4625
页数:7
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