OPERATIONAL TESTING OF LSI ARRAYS BY STROBOSCOPIC SCANNING ELECTRON MICROSCOPY

[1] CRAWFORD RH, 1967, MOSFET CIRCUIT DESIG

[2] GEDES RJ, 1970, 3 P ANN SEM S

[3] Janssen J., 1950, PHILIPS TECH REV PHI, V12, P52

[4] Michels A., 1950, PHILIPS TECH REV PHI, V12, P73

[5] NORTON JF, 1969, P NAT ELEC C, V25

[6] Oatley C.W., 1966, ADV ELECTRON, V21, P181, DOI DOI 10.1016/S0065-2539(08)61010-0

[7] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (06): : 595 - &

[8] PLOWS GS, 1969, THESIS CAMBRIDGE U

[9] PLOWS GS, TO BE PUBLISHED

[10] PROBING OF GUNN EFFECT DOMAINS WITH A SCANNING ELECTRON MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1968, 13 (12) : 407 - +

[1] CRAWFORD RH, 1967, MOSFET CIRCUIT DESIG

[2] GEDES RJ, 1970, 3 P ANN SEM S

[3] Janssen J., 1950, PHILIPS TECH REV PHI, V12, P52

[4] Michels A., 1950, PHILIPS TECH REV PHI, V12, P73

[5] NORTON JF, 1969, P NAT ELEC C, V25

[6] Oatley C.W., 1966, ADV ELECTRON, V21, P181, DOI DOI 10.1016/S0065-2539(08)61010-0

[7] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (06): : 595 - &

[8] PLOWS GS, 1969, THESIS CAMBRIDGE U

[9] PLOWS GS, TO BE PUBLISHED

[10] PROBING OF GUNN EFFECT DOMAINS WITH A SCANNING ELECTRON MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1968, 13 (12) : 407 - +