OPTICAL-PROPERTIES OF ZIRCALOY AND ZIRCALOY OXIDE BY ELLIPSOMETRY

[1] Aspnes D.E., 1976, OPTICAL PROPERTIES S

[2] GEOMETRICALLY EXACT ELLIPSOMETER ALIGNMENT [J]. APPLIED OPTICS, 1971, 10 (05): : 1024 - &

[3] Azzam RMA, 1977, ELLIPSOMETRY POLARIZ

[4] DETERMINATION OF REFRACTIVE INDEX AND THICKNESS OF OXIDE FILMS ON ANODIZED ZIRCONIUM FROM TRANSMISSION INTERFERENCE MEASUREMENTS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1965, 112 (04) : 388 - &

[5] LENHAM AP, 1977, OPTICAL PROPERTIES E

[6] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04): : 363 - +

[7] MULLER RH, 1973, ADV ELECTROCHEMISTRY, V9

[8] PENG YK, J NUCL MATER

[9] WILKINS NJM, 1965, CORROS SCI, V5, P3

[10] HIGH PRECISION ALIGNMENT PROCEDURE FOR AN ELLIPSOMETER [J]. APPLIED OPTICS, 1974, 13 (05): : 1115 - 1120

[1] Aspnes D.E., 1976, OPTICAL PROPERTIES S

[2] GEOMETRICALLY EXACT ELLIPSOMETER ALIGNMENT [J]. APPLIED OPTICS, 1971, 10 (05): : 1024 - &

[3] Azzam RMA, 1977, ELLIPSOMETRY POLARIZ

[4] DETERMINATION OF REFRACTIVE INDEX AND THICKNESS OF OXIDE FILMS ON ANODIZED ZIRCONIUM FROM TRANSMISSION INTERFERENCE MEASUREMENTS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1965, 112 (04) : 388 - &

[5] LENHAM AP, 1977, OPTICAL PROPERTIES E

[6] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04): : 363 - +

[7] MULLER RH, 1973, ADV ELECTROCHEMISTRY, V9

[8] PENG YK, J NUCL MATER

[9] WILKINS NJM, 1965, CORROS SCI, V5, P3

[10] HIGH PRECISION ALIGNMENT PROCEDURE FOR AN ELLIPSOMETER [J]. APPLIED OPTICS, 1974, 13 (05): : 1115 - 1120