APPLICATIONS OF SCANNING PROBE MICROSCOPIES IN TECHNOLOGY AND MANUFACTURING

被引:8
作者
PERSCH, G [1 ]
BORN, C [1 ]
ENGELMANN, H [1 ]
KOEHLER, K [1 ]
UTESCH, B [1 ]
机构
[1] FACHHSCH RUESSELSHEIM,MAINZ,GERMANY
关键词
SCANNING PROBE MICROSCOPY; ATOMIC FORCE MICROSCOPY; NANOHARDNESS OF THIN FILMS; MAGNETIC FORCE MICROSCOPY; APPLICATIONS IN MAGNETIC STORAGE TECHNOLOGY;
D O I
10.1002/sca.4950150507
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Within the last 10 years the scanning probe microscopies (SPMs) have been applied to a variety of problems with the main emphasis on scientific applications. The SPM techniques have to date also found their technical applications. The simple concept can easily be adapted to a variety of different applications in high technologic manufacturing processes. The scanning tunneling microscope is now considered as a standard measuring equipment, in the meantime there exists a whole family of SPMs with promising applications in not only a pure scientific environment but also in a manufacturing environment. As examples for industrial applications, we report on magnetic force microscopic investigations, on magnetic storage device components, and on a relatively new technique for nanohardness investigations of thin-films by an atomic force microscope.
引用
收藏
页码:283 / 290
页数:8
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