共 11 条
- [1] ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 271 - 274
- [3] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J]. EUROPHYSICS LETTERS, 1987, 3 (12): : 1281 - 1286
- [4] Dimigen H., 1983, Philips Technical Review, V41, P186
- [5] ATOMIC FORCE MICROSCOPY - GENERAL-ASPECTS AND APPLICATION TO INSULATORS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 275 - 278
- [6] ATOMIC-SCALE FRICTION OF A TUNGSTEN TIP ON A GRAPHITE SURFACE [J]. PHYSICAL REVIEW LETTERS, 1987, 59 (17) : 1942 - 1945
- [8] COMPARATIVE-STUDY OF LITHIUM-FLUORIDE AND GRAPHITE BY ATOMIC FORCE MICROSCOPY (AFM) [J]. JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 269 - 280
- [10] CHARACTERIZATION OF DIAMOND-LIKE CARBON-FILMS AND THEIR APPLICATION AS OVERCOATS ON THIN-FILM MEDIA FOR MAGNETIC RECORDING [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1987, 5 (06): : 3287 - 3312