MEAN FREE-PATH OF PHOTO-ELECTRONS IN SILICON AND SILICON-OXIDES

被引：21

作者：

BECHSTEDT, F ^{[1
]}

HUBNER, K ^{[1
]}

机构：

[1] WILHELM PIECK UNIV,SEKT PHYS,DDR-2500 ROSTOCK,GER DEM REP

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 67卷 / 02期

关键词：

D O I：

10.1002/pssa.2210670221

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：517 / 526

页数：10

共 43 条

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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 305 - 308

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