X-RAY-SCATTERING FROM POINT-DEFECT AGGREGATES IN SINGLE-CRYSTALS

被引:14
作者
LAL, K
机构
来源
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1989年 / 18卷
关键词
D O I
10.1016/0146-3535(89)90029-4
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
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页码:227 / 266
页数:40
相关论文
共 128 条
[1]  
ABE T, 1981, SEMICONDUCTOR SILICO, P3
[2]  
[Anonymous], 1976, XRAY DIFFRACTION TOP
[3]   DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J].
BATTERMAN, BW ;
COLE, H .
REVIEWS OF MODERN PHYSICS, 1964, 36 (03) :681-&
[4]   TEMPERATURE-DEPENDENT NEUTRON-SCATTERING FROM SILICON SINGLE-CRYSTALS [J].
BEDDOE, RE ;
MESSOLARAS, S ;
STEWART, RJ ;
KOSTORZ, G ;
MITCHELL, EWJ .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1983, 48 (06) :935-952
[5]  
BERGHOLZ W, 1985, J APPL PHYS, V58, P3424
[6]  
BERNEWITZ LI, 1974, APPL PHYS LETT, V23, P277
[7]   TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T) [J].
BONSE, U ;
HART, M .
APPLIED PHYSICS LETTERS, 1965, 7 (09) :238-&
[8]   X-RAY DIFFRACTION EFFECTS OF ATOMIC SIZE IN ALLOYS .2. [J].
BORIE, B .
ACTA CRYSTALLOGRAPHICA, 1959, 12 (04) :280-282
[9]   THE SPACING OF PRISMATIC DISLOCATION LOOPS [J].
BULLOUGH, R ;
NEWMAN, RC .
PHILOSOPHICAL MAGAZINE, 1960, 5 (57) :921-926
[10]   MELTING OF SILICON-CRYSTALS AND A POSSIBLE ORIGIN OF SWIRL DEFECTS [J].
CHIKAWA, J ;
SHIRAI, S .
JOURNAL OF CRYSTAL GROWTH, 1977, 39 (02) :328-340