ON THE MECHANISM OF DIELECTRIC-BREAKDOWN OF SOLIDS

被引：100

作者：

BUDENSTEIN, PP

机构：

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1980年 / 15卷 / 03期

关键词：

D O I：

10.1109/TEI.1980.298315

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：225 / 240

页数：16

共 39 条

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[2] BRADWELL A, 1968, BRIT J APPL PHYS, V1, P1581
[3] BREAKDOWN CONDUCTION IN AL-SIO-AL CAPACITORS
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[4] DESTRUCTIVE BREAKDOWN IN THIN FILMS OF SIO MGF2 CAF2 CEF3 CEO2 AND TEFLON
BUDENSTEIN, PP
HAYES, PJ
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SMITH, WB
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (02): : 289 - +
[5] INTERPRETATION OF DESTRUCTIVE BREAKDOWN IN THIN DIELECTRIC FILMS
BUDENSTEIN, PP
HAYES, PJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 602 - +
[6] BUDENSTEIN PP, 1978, 1975 C EL INS DIEL P, P303
[7] BUDENSTEIN PP, 1974, RG7525 US ARM MISS C
[8] THE INFLUENCE OF IONIC CONDUCTIVITY ON THE ELECTRIC STRENGTH OF KCL AND NACL
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[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1960, 76 (492): : 817 - 825
[9] DISCHARGE PROPAGATION THROUGH SINGLE CRYSTALS OF KBR
COOPER, R
PULFREY, DL
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (02) : 292 - +
[10] DIRECTIONAL ELECTRIC BREAKDOWN OF KCL SINGLE CRYSTALS
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ELLIOTT, CT
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (01) : 121 - &