TRACE-ELEMENT ANALYSIS USING PROTON-INDUCED X-RAY-EMISSION SPECTROSCOPY

被引：52

作者：

VALKOVIC, V ^{[1
]}

LIEBERT, RB ^{[1
]}

ZABEL, T ^{[1
]}

LARSON, HT ^{[1
]}

MILJANIC, D ^{[1
]}

WHEELER, RM ^{[1
]}

PHILLIPS, GC ^{[1
]}

机构：

[1] RICE UNIV, TW BONNER NUCL LABS, HOUSTON, TX 77001 USA

来源：

NUCLEAR INSTRUMENTS & METHODS | 1974年 / 114卷 / 03期

关键词：

D O I：

10.1016/0029-554X(74)90182-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：573 / 579

页数：7

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