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MEASUREMENT OF SURFACE-TOPOGRAPHY OF MAGNETIC TAPES BY MIRAU INTERFEROMETRY
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PHASE-STEPPING INTERFEROMETRY WITH LASER-DIODES - EFFECT OF CHANGES IN LASER POWER WITH OUTPUT WAVELENGTH
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APPLIED OPTICS,
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REAL-TIME DIGITAL HETERODYNE INTERFEROMETRY - SYSTEM
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APPLIED OPTICS,
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HETERODYNE PROFILING INSTRUMENT FOR THE ANGSTROM REGION
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APPLIED OPTICS,
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SINUSOIDAL PHASE MODULATING INTERFEROMETER USING OPTICAL FIBERS FOR DISPLACEMENT MEASUREMENT
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APPLIED OPTICS,
1988, 27 (19)
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